On Wed, Jul 20, 2011 at 06:40:55AM -0400, Martin Langhoff wrote:
Once they learn that a particular key combination "finishes" runin earlier, accidents can happen with surprising frequency.
How is the power button being prevented?
If the problem is that an early termination is indistinguishable from a test success, why not change runin accordingly? I'm happy to do that if needed.
On Thu, Jul 21, 2011 at 08:22:42AM +1000, James Cameron wrote:
On Wed, Jul 20, 2011 at 06:40:55AM -0400, Martin Langhoff wrote:
Once they learn that a particular key combination "finishes" runin earlier, accidents can happen with surprising frequency.
How is the power button being prevented?
If the problem is that an early termination is indistinguishable from a test success, why not change runin accordingly? I'm happy to do that if needed.
I didn't get an answer to my question. This has come up ... Bert has noticed that Ctrl-Alt-Erase doesn't work any more. #11202. The installed base obviously got used to it. Withdrawing a useful feature, even if undocumented, will cause an increase in support costs.
So I've investigated the effect of Ctrl-Alt-Erase on runin.
When manufacturing tag TS is set to RUNIN, runin-main will be run on boot, which will start the X server and execute runin-tests within it.
On normal successful completion, the preserve function in runin-tests replaces /boot/olpc.fth with one that changes the TS tag to SHIP, in inject-tags.
When the X server is terminated by Ctrl-Alt-Erase, runin-tests aborts immediately, and so the preserve function is not executed, and the system is then rebooted. On the next boot, with TS still set to RUNIN, the tests are restarted.
The same thing happens with a battery removal or power button hold.
So, when you say that this key combination "finishes" runin earlier, can you explain your observations further?
If this was the only justification for removing the feature, then I urge you to reconsider, and restore the feature.
On 31 August 2011 18:53, James Cameron quozl@laptop.org wrote:
On Thu, Jul 21, 2011 at 08:22:42AM +1000, James Cameron wrote:
On Wed, Jul 20, 2011 at 06:40:55AM -0400, Martin Langhoff wrote:
Once they learn that a particular key combination "finishes" runin earlier, accidents can happen with surprising frequency.
How is the power button being prevented?
If the problem is that an early termination is indistinguishable from a test success, why not change runin accordingly? I'm happy to do that if needed.
I didn't get an answer to my question. This has come up ... Bert has noticed that Ctrl-Alt-Erase doesn't work any more. #11202. The installed base obviously got used to it. Withdrawing a useful feature, even if undocumented, will cause an increase in support costs.
So I've investigated the effect of Ctrl-Alt-Erase on runin.
When manufacturing tag TS is set to RUNIN, runin-main will be run on boot, which will start the X server and execute runin-tests within it.
On normal successful completion, the preserve function in runin-tests replaces /boot/olpc.fth with one that changes the TS tag to SHIP, in inject-tags.
When the X server is terminated by Ctrl-Alt-Erase, runin-tests aborts immediately, and so the preserve function is not executed, and the system is then rebooted. On the next boot, with TS still set to RUNIN, the tests are restarted.
The same thing happens with a battery removal or power button hold.
So, when you say that this key combination "finishes" runin earlier, can you explain your observations further?
If this was the only justification for removing the feature, then I urge you to reconsider, and restore the feature.
We're currently evaluating 11.3.0, and I recently discovered that Ctrl+Alt+Erase doesn't work on XO-1.5s.
This feature is used by teachers in the field, and by us in testing. Its removal is a regression for us.
I've updated #11202.
Sridhar Dhanapalan Engineering Manager One Laptop per Child Australia
On Fri, Dec 16, 2011 at 08:12:27PM +1100, Sridhar Dhanapalan wrote:
On 31 August 2011 18:53, James Cameron quozl@laptop.org wrote:
On Thu, Jul 21, 2011 at 08:22:42AM +1000, James Cameron wrote:
On Wed, Jul 20, 2011 at 06:40:55AM -0400, Martin Langhoff wrote:
Once they learn that a particular key combination "finishes" runin earlier, accidents can happen with surprising frequency.
How is the power button being prevented?
If the problem is that an early termination is indistinguishable from a test success, why not change runin accordingly? ?I'm happy to do that if needed.
I didn't get an answer to my question. ?This has come up ... Bert has noticed that Ctrl-Alt-Erase doesn't work any more. ?#11202. ?The installed base obviously got used to it. ?Withdrawing a useful feature, even if undocumented, will cause an increase in support costs.
So I've investigated the effect of Ctrl-Alt-Erase on runin.
When manufacturing tag TS is set to RUNIN, runin-main will be run on boot, which will start the X server and execute runin-tests within it.
On normal successful completion, the preserve function in runin-tests replaces /boot/olpc.fth with one that changes the TS tag to SHIP, in inject-tags.
When the X server is terminated by Ctrl-Alt-Erase, runin-tests aborts immediately, and so the preserve function is not executed, and the system is then rebooted. ?On the next boot, with TS still set to RUNIN, the tests are restarted.
The same thing happens with a battery removal or power button hold.
So, when you say that this key combination "finishes" runin earlier, can you explain your observations further?
If this was the only justification for removing the feature, then I urge you to reconsider, and restore the feature.
We're currently evaluating 11.3.0, and I recently discovered that Ctrl+Alt+Erase doesn't work on XO-1.5s.
This feature is used by teachers in the field, and by us in testing. Its removal is a regression for us.
I've updated #11202.
You need not block on this, you only need to configure the X server's DontZap feature back to what it was before.
I think it should be restored for 11.3.1, but I'm a voice in the wilderness on this one.
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James Cameron -
Sridhar Dhanapalan